VLSI test principles and architectures : design for testability :: ISBN 9780123705976 :: Morgan Kaufmann 2006 :: OBNB, the Open British National Bibliography

Publication Data

Title VLSI test principles and architectures : design for testability
Contributors Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Publisher Morgan Kaufmann
Publication date 2006
Publication location San Francisco, Calif.
Language English

Topics

Integrated circuits :: Very large scale integration :: Testing
Integrated circuits :: Very large scale integration :: Design

Catalogue Data

OBNB ID GBA650614
ISBN 10 0123705975
ISBN 13 9780123705976
Type BibliographicResource, Book
Dewey Classification 621.395

ISBD

P1053 xxx, 777 p.
P1042 Includes bibliographical references and index.

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VLSI test principles and architectures : design for testability. ISBN 9780123705976. Published by Morgan Kaufmann in 2006. Publication and catalogue information, links to buy online and reader comments.