Laung-Terng Wang
3 published titles
VLSI test principles and architectures : design for testability
(Contributor)
1 edition
- ISBN: 9780123705976
- Morgan Kaufmann
- 2006
- Details
System-on-chip test architectures : nanometer design for testability
(Contributor)
1 edition
- ISBN: 9780123739735
- Morgan Kaufmann
- 2008
- Details
Electronic design automation : synthesis, verification, and test
(Contributor)
1 edition
- ISBN: 9780123743640
- Morgan Kaufmann
- 2009
- Details