Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits :: Michael L. Bushnell :: ISBN 0792379918 :: Kluwer Academic 2000 :: OBNB, the Open British National Bibliography

Publication Data

Title Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Author Michael L. Bushnell
Contributor Vishwani D. Agrawal
Publisher Kluwer Academic
Publication date 2000
Publication location Boston, Mass.
Language English

Topics

Integrated circuits :: Very large scale integration :: Testing
Digital integrated circuits :: Testing
Mixed signal circuits :: Testing
Semiconductor storage devices :: Testing

Catalogue Data

OBNB ID GBA104514
ISBN 10 0792379918
ISBN 13 n/a
Type BibliographicResource, Book
Dewey Classification 621.395

ISBD

P1053 xviii, 690 p.
P1042 Includes bibliographical references and index.

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Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits by Michael L. Bushnell. ISBN 0792379918. Published by Kluwer Academic in 2000. Publication and catalogue information, links to buy online and reader comments.