Power-aware testing and test strategies for low power devices

Publication Data

• Title Power-aware testing and test strategies for low power devices
• Contributors Patrick Girard, Nicola Nicolici, Xiaoqing Wen
• Publisher Springer
• Publication date 2010
• Publication location New York
• Language English

Topics

• Low voltage integrated circuits :: Power supply
• 015342051

Power-aware testing and test strategies for low power devices. ISBN 9781441909282. Published by Springer in 2010. Publication and catalogue information, links to buy online and reader comments.